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CES Xact 640 system monitors stack HAP metal emissions using reel-to-reel (RTR) filter tape sampling and nondestructive X-ray fluorescence (XRF) analysis.
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An isokinetic sub-sample of stack gas is taken from the stilling chamber and drawn through a chemically reactive filter tape. Vapor phase metals, including mercury (Hg) and other particulate matter (PM) are deposited on the filter tape. The deposit is automatically advanced and analyzed by XRF for selected metals as the next sample is being collected. Hence sampling and analysis are performed continuously and simultaneously, except during advancement of the tape (~20 sec) and during daily automated quality assurance checks.